In-Circuit testing is one of the best ways to find common defects. Testing shorts and open are the first step, followed by the verification of passive components and finally testing the functionality of digital and analog powered components. In most cases, the internal logic of the components will be used to test the device, but for more complex components, Boundary Scan (IEEE-1149.1) is used.

TECHNICAL FEATURES

• Development on Agilent 3070 systems
• Web base project follow-up
• Turnkey project, debugged at 100% at Mindready's premises
• Programming of IC on board (Xilinx, FPGA, Altera, Flashs)
• Functional and custom tests
• Complete test development via (in the following order):
  • Boundary scan if available
  • VCL test
  • Testjet technique with VCL presence test

BENEFITS

• Increase yield at functional test stage
• Increase product quality and life expectancy
• Increase production throughput
• Save on trouble shooting costs

Reassurance

Yelo 7000 series
The Yelo system range is the tight combination of in-circuit and functional tests. This allows both types of testing to be combined without the need for large numbers of test and measurement cards in the test system this gives flexibility of test strategies. You may wish to start now with 100% in-circuit and some minimal functional, but you have the reassurance of knowing that you can move to reduced in-circuit and increased functional if a dense surface mount board must be tested later.